XRD Diffractometer LD-LXRD-B10 is comprised with perfect combination of hardware and software systems, features high-precision diffraction angle measuring system with 0.0012° to 50°/min of scanning speed and -6 to 160° of 2θ scanning range. Integrated design with metal ceramic tube with multiple target material, and sample level (θ to θ) goniometer structure, has PC or SC, SDD and high-speed 1D semiconductor array detector. Equipped with different counting fashion and scanning fashion, X-ray generator control system and high frequency high voltage control technology, offers programmable operation and can perform different test using functional accessories.
SKU Code: LD-LXRD-B10
| Detector | Proportional counters (PC) or scintillation counter (SC), Silicon drift detector (SDD), High speed one-dimensional semiconductor array detector |
| Stability | ≤0.005% |
| Focus size | 1×10 mm, 0.4×14 mm or 2×12 mm |
| Net weight | 340 kg |
| X-ray tube | Metal ceramic tube: Cu, Fe, Co, Cr, Mo, etc.; Power: 2.4 kW |
| Rated power | 3 kV (HV, HF control technology) |
| Tube current | 5 to 50 mA |
| Tube voltage | 10 to 60 kV |
| Scanning speed | 0.0012° to 50°/min |
| Counting fashion | Differential coefficient or integral, PHA automatically, dead time regulate |
| Scanning fashion | θs/θd linkage / single action; continuous, stepping and Omg |
| 2θ Scanning range | -6 to 160° |
| Diffraction radius | 225 mm |
| Scattered ray dose | 1uSv/h |
| 01 Box Gross weight | 350 kg |
| 02 Box Gross weight | 240 kg |
| Angle locating speed | 1500°/min |
| Goniometer structure | Sample level (θ to θ) |
| 2θ Angular linearity | International standard sample (Si, Al203), the angle deviation of all peak in full spectrum are not more than ±0.022 |
| Minimal stepping angle | 1/10000° |
| Energy resolution ratio | ≤25%（PC, one-dimensional array), ≤50%(SC), ≤200 eV (SDD) |
| System measure stability | ≤0.01% |
| Angle repeatable accuracy | 1/10000° |
| Maximum linear count rate | >5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (SSD), 9×102 (1D array) |
| Machine dimension (L×W×H) | 1000×800×1600 mm |
| 01 Box Package dimension (L×W×H) | 1190×1020×2000 mm |
| 02 Box Package dimension (L×W×H) | 1250×1035×1050 mm |
| XRD diffractometer is used to analyze natural or synthetic inorganic or organic materials, widely used in clay minerals, cement building materials, environmental dust, chemical products, drugs, asbestos, rock minerals, polymers and other research fields. |
