Features

  • Large range of sample transfer
  • Modular electronic system for easy maintenance
  • Adopted with spring for vibration isolation
  • Provides highly accurate results
  • Optical observation system for checking tip & sample’s position

Atomic force microscope LD-LAFM-A10

Atomic force microscopeLD-LAFM-A10comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

SKU Code: LD-LAFM-A10

Also Available in below capacities

Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan rate 0.6 Hz to 4.34 Hz
Net weight 40 kg
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Scan angle Random angle
Sample size Ø≤ 90 mm, H≤ 20 mm
Gross Weight 50 kg
Feedback type DSP digital feedback
Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
PC connections: USB 2.0
Sample movement 0 to 20 mm
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Windows software Compatible with windows 98/2000/XP/7/8
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Instrument Diemnsion 415 × 410 × 545 mm
Feedback sampling rate 64 KHz
Types of sampling pixel 256×256, 512×512
Pulse width of approaching motor 10 ± 2 ms
Optical system/ Magnification of CCD Magnification: 4x, Resolution: 2.5 µm
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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