Features

  • Large sample transfer range
  • Optical observation system for checking tip & sample’s position
  • Modular electronic system for easy maintenance
  • CCD observing system
  • Equipped with servomotor to achieve CCD auto focusing
  • Provides highly accurate results

Atomic force microscope LD-LAFM-A11

Atomic force microscopeLD-LAFM-A11comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

SKU Code: LD-LAFM-A11

Also Available in below capacities

Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan rate 0.6 Hz to 4.34 Hz
Net weight 50 kg
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Scan angle 0 to 360°
Sample size Ø≤ 90 mm, H≤ 20 mm
Gross Weight 87.4 kg
Feedback type DSP digital feedback
Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
PC connections: USB 2.0
Sample movement 0 to 20 mm
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Windows software Compatible with windows 98/2000/XP/7/8
Maximum scan range X/Y axis: 50 µm, Z axis: 5 µm
Instrument Diemnsion 700 × 500 × 460 mm
Feedback sampling rate 64 KHz
Types of sampling pixel 256×256, 512×512
Pulse width of approaching motor 10 ± 2 ms
Optical system/ Magnification of CCD Magnification: 10x, Resolution: 1 µm
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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